Engineering Fixture Capabilities
Functional IC Test Fixtures
Custom functional test fixtures designed for semiconductor validation, signal verification, and engineering debugging.
Features include:
- Stable electrical contact
- Accurate interface alignment
- Repeatable testing performance
- Engineering-focused signal access
Supported packages
- QFN
- QFP
- BGA
- SOP
- DIP
- LGA
Typical engineering support includes
- MCU validation
- ADC/DAC testing
- Communication IC verification
- Analog signal evaluation
- Embedded system debugging
MCU Programming Fixtures
Reliable programming fixtures for firmware flashing and MCU programming workflows.
Supports:
- ISP programming
- Offline programming
- Flash memory programming
- Wireless module programming
- Engineering verification programming
Compatible platforms may include
- STM32
- ESP32
- NRF52
- FPGA devices
- Programmable ICs
Designed for
- Engineering laboratories
- Prototype validation
- Low-volume production preparation
- Firmware verification workflows
Burn-In Test Fixtures
Burn-in fixtures designed for semiconductor aging and reliability screening environments.
Supports:
- Thermal stress testing
- Semiconductor aging validation
- Reliability screening
- Qualification testing
- High-temperature IC evaluation
Our fixture structures focus on:
- Stable mechanical design
- Repeatable contact performance
Continuous operation capability
Electrical Parameter Test Fixtures
Fixture solutions for engineering measurements and semiconductor validation.
Supports:
- Voltage testing
- Current measurement
- Waveform analysis
- I/O timing verification
- Power consumption evaluation
- Engineering signal testing
Designed to improve testing consistency during engineering debugging and embedded system development.
Pogo-Pin Bed-of-Nails Fixtures
Customized pogo-pin fixtures for repeatable IC and module testing workflows.
Features include:
Fast electrical contact
Repeatable testing performance
Engineering validation support
Low-volume production support
Module interface verification
Commonly used in embedded electronics, communication modules, and prototype testing environments.